25mm | φ30mm | F2.8 | M42-Mount – 4K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE2528-M42 |
| Focal Length | 25mm |
| Sensor Size | Φ30mm |
| F No. | F2.8 |
| Working Distance | 0.2m~Inf. |
| TV Distortion | -0.09% |
| Aperture Operation | Manual | |
| Focus Operation | Manual | |
| FOV | Φ28.7mm | 59.7° |
| Φ14.4mm | 32.1° | |
| Mount | M42x1mm | |
| Dimension | Φ59×98.8mm | |
| Filter Size | M55,P=0.75mm | |
| Weight | 476g | |
| Temperatue Range | -20℃~60℃ | |
| WD(mm) | Mag. | FOV(mm) | WD(mm) | Mag. | FOV(mm) | ||
| 4K7μ | 2K7μ | 4K7μ | 2K7μ | ||||
| 100 | 0.250X | 115 | 58 | 600 | 0.042X | 689 | 346 |
| 150 | 0.167X | 172 | 86 | 650 | 0.038X | 746 | 374 |
| 200 | 0.125X | 230 | 115 | 700 | 0.036X | 804 | 403 |
| 250 | 0.100X | 287 | 144 | 750 | 0.033X | 861 | 432 |
| 300 | 0.083X | 344 | 173 | 800 | 0.031X | 918 | 461 |
| 350 | 0.071X | 402 | 202 | 900 | 0.028X | 1033 | 518 |
| 400 | 0.063X | 459 | 230 | 1000 | 0.025X | 1148 | 576 |
| 450 | 0.056X | 517 | 259 | 1200 | 0.021X | 1378 | 691 |
| 500 | 0.050X | 574 | 288 | 1500 | 0.017X | 1722 | 864 |
| 550 | 0.045X | 631 | 317 | 2000 | 0.013X | 2296 | 1152 |