60mm | φ60mm | F4.0 | M72-Mount – 16K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC- LSE6040B-M72 | |
| Focal Length | 60mm | |
| F No. | F4.0-F22 | |
| Resolution | 16K3.5μ | |
| Sensor Size | Φ60mm | |
| Mount | M72*0.75 | |
| Optical Distortion | 0.70% | |
| Waveband | 400nm-700nm | |
| Weight | 786g | |
| Working Distance | 600mm-Inf. | |
| OBFL | 18mm | |
| BFL | 12mm | |
| Filter Size | M58*0.75 | |
| Temperature Range | -20℃-60℃ | |
| Operation | Focus | Manual |
| Aperture | Manual | |
| WD(mm) | Mag.(x) | Length(mm) | I/O(mm) | RI(%) | FOV(mm) | |
| Φ28.672 | Φ57.4 | |||||
| 5000 | 0.01204 | 116.8 | 5128.6 | 70.02% | 2385.956 | 4788.122 |
| 3000 | 0.02 | 117.249 | 3129.02 | 70.81% | 1427.092 | 2864.302 |
| 2500 | 0.02419 | 117.5 | 2629.3 | 70.98% | 1188.096 | 2385.006 |
| 2000 | 0.0303 | 117.879 | 2129.65 | 71.30% | 947.866 | 1902.8 |
| 1800 | 0.0337 | 118.079 | 1929.85 | 71.46% | 852.168 | 1710.808 |
| 1600 | 0.03798 | 118.335 | 1730.1 | 71.66% | 756.418 | 1518.688 |
| 1400 | 0.0434 | 118.683 | 1530.4 | 71.87% | 661.298 | 1327.838 |
| 1300 | 0.04689 | 118.883 | 1430.6 | 72.03% | 613.406 | 1231.738 |
| 1200 | 0.051 | 119.1 | 1330.9 | 72.20% | 565.534 | 1135.68 |
| 1100 | 0.05558 | 119.387 | 1231.2 | 72.41% | 517.564 | 1039.424 |
| 1000 | 0.06125 | 119.8 | 1131.5 | 72.66% | 469.628 | 943.234 |
| 900 | 0.06822 | 120.214 | 1031.9 | 72.96% | 421.718 | 846.374 |
| 800 | 0.07697 | 120.734 | 932.4 | 73.76% | 373.806 | 750.936 |
| 700 | 0.0883 | 121.4 | 833.1 | 74.23% | 325.926 | 654.842 |
| 650 | 0.0969 | 123.992 | 786.05 | 75.77% | 296.738 | 595.8 |