1.1″ | 0.168X | F6.5 | 25μ – Bi-Telecentric Lens

Features

• High telecentricity design, minimum telecentricity of full field of view is less than 0.03°
• Maximum distortion <0.016%, ensuring consistency of dynamic repeatability measurement results
• Suppress stray light design, eliminate interference with imaging quality
• Large depth of field design

Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.

Resources

Download Datasheet(PDF)