1″ | 0.185X | F6.5 | 5mm – High Precision Bi-Telecentric Lens
Features
Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.
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| Model No. | JC-CTH10185-208 |
| Optical Structure | High Precision Bi-Telecentric |
| Magnification | 0.185X |
| Object FOV | Φ90mm |
| Working Distance | 208±2mm |
| CCD Size | Φ16.6(1”)mm | |
| F No. | F6.5 | |
| Telecentricity | <0.1° | |
| Image Distortion | <0.1% | |
| Image MTF30 | >165lp/mm | |
| Depth of Field | ±5mm | |
| Conjugate Distance | 458.8mm | |
| FOV Range | 12.85×9.64 with KAI-0450 | 69.4mmx52.1mm |
| Mount | C-Mount | |
| Length | 233.3mm | |
| Parallel(Telecentric)Light Source | VCL-90-xW-y | |
| Beam Diameter 90mm | ||