35mm | φ30mm | F2.8-F16 | M42-Mount – 4K Line Scan And Large Format Lens

Features

• Large target surface 4K7μ, large aperture F2.8, 0.0x~0.5x
• Large target surface φ30mm
• Large aperture F2.8
• Uniform imaging, no distortion at 0.1X
• Tight focus fastening method

With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.

Resources
Download Datasheet(PDF)