40mm | φ60mm | F4.0 | M72x0.75-6g-Mount – 8K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE4040N |
| Focal Length | 40mm |
| Sensor Size | Φ60mm |
| F No. | F4.0-F16 |
| Working Distance | 150mm~∞ |
| Mount | M72x0.75-6g |
| Weight | g |
| Temperature Range | -20℃~+60℃ |
| Filter Size | External Filter |
| Mag. | FOV 16K3.5μ | WD mm | O/I mm | Distortion | Extension Ring |
| 0.266x | 215 | 150 | 300 | -0.82% | Not Add |
| 0.162x | 354 | 250 | 396 | -0.64% | Not Add |
| 0.117x | 492 | 350 | 494 | -0.48% | Not Add |
| 0.091x | 630 | 450 | 594 | -0.36% | Not Add |
| 0.082x | 698 | 500 | 643 | -0.30% | Not Add |
| 0.069x | 836 | 600 | 743 | -0.22% | Not Add |
| 0.052x | 1110 | 800 | 942 | -0.09% | Not Add |
| 0.041x | 1384 | 1000 | 1142 | -0.01% | Not Add |
| 0.032x | 1795 | 1300 | 1442 | 0.08% | Not Add |
| 0.026x | 2206 | 1600 | 1742 | 0.14% | Not Add |
