40mm | φ60mm | F4.0 | M72-Mount – 8K/16K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE4040A-M72 |
| Sensor Size | Φ60mm(8K7μ/16K3.5μ) |
| Magnification | 0.262X-0.05X |
| Focal Length | 40mm±0.05 |
| Optical Length | 149.65mm±0.2 |
| F No. | F4.0±0.1 |
| MBFL | 5.95mm±0.2 |
| FOV | 71.2°φ60mm |
| CRA | 24.28°±2° |
| Optical Distortion | -0.88%±5% |
| Relative Illumination | 50%±5% |
| Working Distance | 150mm~800mm |
|
8K7μ 40mm Mag. Reference |
|
| Object Distance(mm) | Magnification(x) |
| 150 | -0.262 |
| 200 | -0.197 |
| 250 | -0.159 |
| 300 | -0.132 |
| 350 | -0.114 |
| 400 | -0.0997 |
| 450 | -0.089 |
| 500 | -0.08 |
| 550 | -0.073 |
| 600 | -0.067 |
| 650 | -0.0617 |
| 700 | -0.057 |
| 750 | -0.054 |
| 800 | -0.05 |