1.1″ | 0.134X | F6.18 | ±8mm – High Precision Bi-Telecentric Lens
Features
Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.
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| Model No. | JC-CTH0136X-288 |
| Optical Structure | Bi-Telecentric |
| Magnification | 0.134X |
| Object FOV | Φ136mm |
| Working Distance | 288±4mm |
| CCD Size | Φ18.4mm(1.1”) | |
| F No. | F6.18 | |
| Telecentricity | <0.1° | |
| Image Distortion | <0.1% | |
| Image MTF30 | >142lp/mm | |
| Depth of Field | ±8mm | |
| I/O | 709.9mm | |
| FOV Range | 14.13×10.35 with IMX304 | 105.4mmx77.2mm |
| Mount | C-Mount | |
| Length | 404.4mm | |
| Parallel(Telecentric)Light Source | VCL-136-xW-y | |
| Beam Diameter 136mm | ||