1.1″ | 0.204X | F6.2 | 4mm – High Precision Bi-Telecentric Lens
Features
Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.
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| Model No. | JC-CTH110204-208 |
| Optical Structure | High Precision Bi-Telecentric |
| Magnification | 0.204X |
| Object FOV | Φ90mm |
| Working Distance | 208±2mm |
| CCD Size | Φ18.4(1.1”)mm | |
| F No. | F6.2 | |
| Telecentricity | <0.1° | |
| Image Distortion | <0.1% | |
| Image MTF30 | >132lp/mm | |
| Depth of Field | ±4mm | |
| Conjugate Distance | 472mm | |
| FOV Range | 14.13×10.35 with IMX304 | 69.2mmx50.7mm |
| Mount | C | |
| Length | 246.5mm | |
| Parallel(Telecentric)Light Source | VCL-90-xW-y | |
| Beam Diameter 90mm | ||