Φ23.8mm | 0.74X | F8.5 | 1.7mm – Bi-Telecentric Lens

Features

• Large image area, high-pixel imaging system design
• Wide field of view to meet various field-of-view requirements
• Large aperture, high telecentricity, ultra-low distortion, and exceptional depth of field meet high-end system requirements

Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.

Resources

Download Datasheet(PDF)