Products
JC-CTH11075X-65C
Φ23.8mm | 0.74X | F8.5 | 1.7mm – Bi-Telecentric Lens
Features
- Large image area, high-pixel imaging system design
- Wide field of view to meet various field-of-view requirements
- Large aperture, high telecentricity, ultra-low distortion, and exceptional depth of field meet high-end system requirements
Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.
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Description
Description
Product Parameter
| Model No. | JC-CTH11075X-65C | ||
| Optical Structure | Bi-Telecentric | ||
| Magnification | 0.74X | ||
| Object FOV | Φ23.8mm | ||
| Image FOV | Φ17.6mm | ||
| Working Distance | 65mm±3% | ||
| Telecentricity | ＜0.28° | ||
| Depth of Field | 1.7mm | ||
| F No. | F8.5 | ||
| Resolution | 7.6μm | ||
| Image MTF | ＞0.3@120lp/mm | ||
| Optical Distortion | ＜0.060% | ||
| Measurement Range | Sensor Specification | Sensor Size | FOV |
| 1.1” | 14.2mmx10.4mm | 19.2mmx14.1mm | |
| 2/3” | 8.45mmx7.07mm | 11.4mmx9.6mm | |
| 1/2” | 6.4mmx4.8mm | 8.6mmx6.5mm | |
| 1/3” | 4.8mmx3.6mm | 6.5mmx4.9mm | |
Dimensions
