Φ33(2″)mm | 0.514X | F9.6 | ±2.5mm – High Precision Bi-Telecentric Lens
Features
Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.
Resources
Inquiry Now
| Model No. | JC-CTH20514-159 |
| Optical Structure | High Precision Bi-Telecentric |
| Magnification | 0.514X |
| Object FOV | Φ64mm |
| Working Distance | 159±2mm |
| CCD Size | Φ33(2”)mm | |
| F No. | F9.6 | |
| Telecentricity | <0.1° | |
| Image Distortion | <0.1% | |
| Image MTF30 | >98lp/mm | |
| Depth of Field | ±2.5mm | |
| Conjugate Distance | 424mm | |
| FOV Range | 2”KAI-16050(26.93×17.95) | 52.3mmx34.9mm |
| Mount | M58/F | |
| Length | 253.2mm | |
| Parallel(Telecentric)Light Source | VCL-64P-xW-y | |
| Beam Diameter 64mm | ||