Φ33(2”)mm | 0.514X | F9.6 | ±2.5mm – High Precision Bi-Telecentric Lens

Features

• Large image area, high-pixel imaging system design
• FOV ranges from 26mm to 300mm, meeting diverse field of view requirements
• Large aperture, high telecentricity, ultra-low distortion, and exceptional depth of field meet high-end system requirements

Suitable for semiconductor inspection, transparent material inspection, glass bottle defect recognition, high-speed measurement and other industry applications, online screening of lithium electrode coating defects.

Resources

Download Datasheet(PDF)