25mm | φ29mm | F4 | M42/F-Mount/V-Mount-4K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE2540-M42 |
| Focal Length | 25mm |
| Sensor Size | Φ29mm |
| F No. | F4-F16 |
| Working Distance | 300mm~∞ |
| Mount | M42x1.0/F-Mount/V-Mount |
| Weight | 279g |
| Temperature Range | -20℃~+60℃ |
| Filter Size | M43x0.75-6g |
| WD mm | O/I mm | Object FOV mm | Image FOV | Mag. |
| 1245.45 | 1328.48 | 1444.18 | 4096×7.05μ | 0.02x |
| 830.45 | 913.73 | 967.44 | 4096×7.05μ | 0.03x |
| 623.45 | 706.98 | 729.54 | 4096×7.05μ | 0.04x |
| 495.45 | 579.24 | 582.34 | 4096×7.05μ | 0.05x |
| 410.45 | 494.49 | 484.54 | 4096×7.05μ | 0.06x |
| 350.45 | 434.75 | 415.46 | 4096×7.05μ | 0.07x |
