28mm | φ43mm | F4.0 | M42/M58/M72-Mount – 8K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE2840 |
| Focal Length | 28mm |
| Sensor Size | Ø43mm |
| F No. | F4.0-F11 |
| Working Distance | 150mm~∞ |
| Mount | M42/M58/M72 |
| Weight | g |
| Temperature Range | -20℃~+60℃ |
| Filter Size | M43x0.75-6g |
| WD mm | O/I mm | Mag. | Distortion | FOV 8K5μm |
| 500 | 597.6 | 0.055 | 1.16% | 748 |
| 600 | 697.4 | 0.046 | 1.15% | 896 |
| 700 | 797.2 | 0.039 | 1.14% | 1043 |
| 800 | 897.1 | 0.034 | 1.13% | 1191 |
| 900 | 996.9 | 0.031 | 1.13% | 1338 |
| 1000 | 1096.9 | 0.028 | 1.12% | 1486 |
| 1250 | 1346.7 | 0.022 | 1.12% | 1854 |
| 1500 | 1596.6 | 0.018 | 1.11% | 2223 |
| 1750 | 1846.5 | 0.016 | 1.10% | 2592 |
| 2000 | 2096.5 | 0.014 | 1.10% | 2960 |
