40mm | φ43mm | F3.2 | F/M42/M48/M58/M72/M90-Mount – 8K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE4032 |
| Focal Length | 40mm |
| Sensor Size | φ43mm |
| F No. | F3.2-F16 |
| Working Distance | 100mm~∞ |
| Mount | F/M42/M48/M58/M72/M90 |
| Weight | 156@F-Mount |
| Temperature Range | -20℃~+60℃ |
| Filter Size | M43.0x0.75 |
| Mag. | FOV mm | WD mm | O/I mm | Distortion | Extension Ring |
| 0.334X | 129 | 130 | 219 | -0.42% | Not Add |
| 0.287X | 150 | 150 | 237 | -0.39% | Not Add |
| 0.252X | 170 | 170 | 255 | -0.37% | Not Add |
| 0.203X | 212 | 210 | 293 | -0.33% | Not Add |
| 0.185X | 233 | 230 | 312 | -0.31% | Not Add |
| 0.170X | 253 | 250 | 332 | -0.29% | Not Add |
| 0.146X | 295 | 290 | 371 | -0.26% | Not Add |
| 0.120X | 357 | 350 | 430 | -0.22% | Not Add |
| 0.103X | 419 | 410 | 489 | -0.19% | Not Add |
| 0.079X | 544 | 530 | 608 | -0.14% | Not Add |
| 0.060X | 720 | 700 | 777 | -0.10% | Not Add |
| 0.044X | 978 | 950 | 1027 | -0.06% | Not Add |
| 0.040X | 1082 | 1050 | 1126 | -0.04% | Not Add |
