40mm | φ60mm | F4.0 | M72x0.75-6g-Mount – 8K Line Scan And Large Format Lens

Features

• Ultra-large image plane φ60mm
• Support 16K3.45μ high-resolution line scan camera
• Ultra-low optical distortion, uniform imaging at the center and edge
• Strict chromatic aberration correction
• Suitable for large-format high-precision detection

With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.

Resources
Download Datasheet(PDF)