60mm | φ60mm | F4.0 | F/M42/M48/M58/M72-Mount – 8K/16K Line Scan And Large Format Lens
Features
With high resolution, high-speed scanning capability and large field of view, it provides efficient solutions for semiconductor inspection, photovoltaic industry, FPD inspection, factory automation vision tasks such as 3D-AOI and SPI, continuous material inspection, medical imaging, and image recognition and analysis in scientific research.
Resources
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| Model No. | JC-LSE6040HI-IR |
| Focal Length | 60mm |
| Sensor Size | Φ60mm |
| F No. | F4.0-F16 |
| Working Distance | 210mm~∞ |
| Mount | F/M42/M48/M58/M72 |
| Weight | 189.2g |
| Temperature Range | -20℃~+60℃ |
| Filter Size | M43x0.75-6g |
| WD mm | I/O mm | Object FOV mm | Image FOV | Mag. |
| 1243.69 | 1311.59 | 938.58 | 8192×7.05μ | 0.05x |
| 793.69 | 883.39 | 719.96 | 8192×7.05μ | 0.08x |
| 633.69 | 724.69 | 568.35 | 8192×7.05μ | 0.10x |
| 501.69 | 594.43 | 443.24 | 8192×7.05μ | 0.13x |
| 438.69 | 494.49 | 484.54 | 8192×7.05μ | 0.15x |
| 333.69 | 430.86 | 283.90 | 8192×7.05μ | 0.20x |
| 277.69 | 377.71 | 230.74 | 8192×7.05μ | 0.25x |
| 218.69 | 391.99 | 174.70 | 8192×7.05μ | 0.33x |